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Published by Van Nostrand Reihnold in New York .
Written in English

Subjects:

  • Electronic apparatus and appliances -- Effect of radiation on.

Book details:

Edition Notes

Includes bibliographical references and index.

StatementGeorge C. Messenger, Milton S. Ash.
ContributionsAsh, Milton S.
Classifications
LC ClassificationsTK7870 .M4425 1991
The Physical Object
Paginationxx, 951 p. :
Number of Pages951
ID Numbers
Open LibraryOL1539688M
ISBN 100442239521
LC Control Number91018233

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Book Abstract: This book provides the reader with knowledge of a wide variety of radiation fields and their effects on electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important. Prompt-dose effects 59 Chapter 5: Radiation sensitivity by technology Total ionizing dose 63 Single-event effects 67 Chapter 6: Mitigating radiation effects in electronics Radiation robustness by serendipity 75 Radiation hardening by process 77 Radiation hardness by design –.   This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.